Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 22, Issue 6, Pages 1311-1318Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.201101796
Keywords
graphene composite; Conductive-AFM; Electrostatic Force Microscopy; 3D reconstruction
Categories
Funding
- Dutch Polymer Institute [615, 648]
- Federal Program Scientific and educational research personnel of innovative Russia [02.740.11.5119]
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The local electrical properties of a conductive graphene/polystyrene (PS) composite sample are studied by scanning probe microscopy (SPM) applying various methods for electrical properties investigation. We show that the conductive graphene network can be separated from electrically isolated graphene sheets (GS) by analyzing the same area with electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM). EFM is able to detect the graphene sheets below the sample surface with the maximal depth of graphene detection up to approximate to 100 nm for a tip-sample potential difference of 3 V. To evaluate depth sensing capability of EFM, the novel technique based on a combination of SPM and microtomy is utilized. Such a technique provides 3D data of the GS distribution in the polymer matrix with z-resolution on the order of approximate to 10 nm. Finally, we introduce a new method for data correction for more precise 3D reconstruction, which takes into account the height variations.
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