4.6 Article

Imaging of Cell-to-Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D-Fibrous Structures

Journal

ADVANCED ENGINEERING MATERIALS
Volume 11, Issue 11, Pages B182-B188

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adem.200900080

Keywords

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Funding

  1. Department of Pharmaceutical Science, ETH, Zurich
  2. CCMC
  3. Competence Centre for Materials Sciences and Technology

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