Journal
INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE
Volume 51, Issue 12, Pages 6083-6094Publisher
ASSOC RESEARCH VISION OPHTHALMOLOGY INC
DOI: 10.1167/iovs.10-5470
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Funding
- National Eye Institute [R01EY016134, R01EY017367, R01EY019475]
- NEI-IPA
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [832760] Funding Source: National Science Foundation
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The atomic force microscope (AFM) is widely used in materials science and has found many applications in biological sciences but has been limited in use in vision science. The AFM can be used to image the topography of soft biological materials in their native environments. It can also be used to probe the mechanical properties of cells and extracellular matrices, including their intrinsic elastic modulus and receptor-ligand interactions. In this review, the operation of the AFM is described along with a review of how it has been thus far used in vision science. It is hoped that this review will serve to stimulate vision scientists to consider incorporating AFM as part of their research toolkit. (Invest Ophthalmol Vis Sci. 2010;51:6083-6094) DOI:10.1167/iovs.10-5470
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