4.7 Article

Formation of conductive and reflective silver nanolayers on plastic films via ion doping and solid-liquid interfacial reduction at ambient temperature

Journal

ACTA MATERIALIA
Volume 61, Issue 11, Pages 4080-4090

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2013.03.032

Keywords

Polymer matrix composites; Thin films; Conductivity; Reflectivity; Interfaces

Funding

  1. National Natural Science Foundation of China (NSFC) [51273018]
  2. Program for Changjiang Scholars and Innovative Research Team in University (PCSIRT) [IRT0706]

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Conductive and reflective silver layers on both sides of polyimide films have been prepared by doping silver ammonia ions into the surfaces of polyimide film, and subsequent solid liquid interfacial reduction, during which double diffusion of silver ions and newly formed silver crystals occurred between the interfaces of polyimide films and the aqueous reducing surroundings. The newly formed silver nanoparticles could migrate and aggregate onto both sides of substrate films, forming continuous and compact silver layers that result in excellent conductivity, i.e. similar to 0.6 and 0.5 Omega/sq on the upside and downside surfaces, respectively. The surface reflectivity could be detected up to 80% on the downside and 90% on the upside surface as well. The effects of the silver contents and reducing conditions on the morphologies and properties have been investigated comprehensively, and the two-side properties differences were discussed. A convictive relationship between the morphologies and properties has been established, providing reliable and general guidance in terms of preparation of inorganic nanoparticles on plastic substrates. This novel and simple strategy can be extended to fabricate many other metal, metal oxide and metal sulfide nanoparticles on plastic substrates, using proper oxidants or sulfions to replace the diverse reductants. The films were characterized by inductively coupled plasma, contact angle measurement, X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy, transmission electron microscopy, atomic force microscopy, four-point probe instrument and ultraviolet spectrophotometry. (C) 2013 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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