Journal
ACTA MATERIALIA
Volume 59, Issue 7, Pages 2823-2830Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2011.01.021
Keywords
EBSD; Cube texture; La2Zr2O7; Seed layer; Accelerating voltage
Funding
- National Basic Research Program 973 of China [2006CB601005]
- National High Technology Research and Development Program 863 of China [2009AA032401]
- National Natural Science Foundation of China [50771003, 50802004]
- Beijing Municipal Natural Science Foundation [2092006]
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La2Zr2O7 (LZO) buffer layers derived by metal organic deposition (MOD) were epitaxially grown on cube textured Ni5W substrates modified with an island-distributed LZO seed layer, and electron backscattered diffraction (EBSD) was employed to characterize the crystallographic relationship of the {0 0 1}< 1 1 0 > rotated cube textured LZO grains with respect to the {0 0 1}< 1 0 0 > cube textured Ni5W substrate. The uniformly distributed, islanded seed layer can effectively optimize the orientation of the double-layered LZO films, as proved by X-ray diffraction and EBSD analyses. It is concluded that the accelerating voltage is crucial for determinating the crystallographic orientation of the multilayer sample. Information about the epi-layer and the substrate was obtained at different accelerating voltages, which revealed, in particular, a superposed pattern of both layers. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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