Journal
ACTA MATERIALIA
Volume 57, Issue 14, Pages 4304-4311Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2009.06.004
Keywords
Nickel; Grain boundary energy; Microstructure; Electron backscattering diffraction (EBSD); Focused ion beam (FIB)
Funding
- National Science Foundation [DMR-0520425]
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The three-dimensional interfacial network of grain boundaries in polycrystalline nickel has been characterized using a combination of electron backscatter diffraction mapping and focused ion beam serial sectioning. These data have been used to determine the relative areas of different grain boundary types, categorized on the basis of lattice misorientation and grain boundary plane orientation. Using the geometries of the interfaces at triple lines, relative grain boundary energies have also been determined as a function of lattice misorientation and grain boundary plane orientation. Grain boundaries comprising (1 1 1) planes have, on average, lower energies than other boundaries. Asymmetric tilt grain boundaries with the Sigma 9 misorientation also have relatively low energies. The grain boundary energies and areas are inversely correlated. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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