Growth and characterization of tetragonal bismuth ferrite-lead titanate thin films

Thin films of tetragonal bismuth ferrite-lead titanate (1 - x)BiFeO3-xPbTiO(3) with x = 0.9-0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (1 1 1) texture. The film microstructure was studied using SEM. The ferroelectric properties of the films are discussed in the light of polarization-field hysteresis behaviour and impedance spectroscopy. The remanent polarization values ranged between 2P(r) similar to 45 and similar to 60 mu C cm(-2) at a field amplitude of 500 kV cm(-1) and -10 degrees C, while the dielectric permittivity of the films ranged between 375 and 1096 at a frequency of 2 kHz. (c) 2008 Acta Materialia, Inc. Published by Elsevier Ltd. All rights reserved.