4.8 Article

Scalable Growth of High-Quality Polycrystalline MoS2 Monolayers on SiO2 with Tunable Grain Sizes

Journal

ACS NANO
Volume 8, Issue 6, Pages 6024-6030

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nn5020819

Keywords

MoS2; chemical vapor deposition (CVD); Raman spectrum; photoluminescence; field effect transistor

Funding

  1. National Basic Research Program of China (973 Program) [2013CB934500, 2012CB921302]
  2. National Science Foundation of China (NSFC) [91223204, 61325021, 11204358, 11174333]
  3. Chinese Academy of Sciences

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We report a scalable growth of monolayer MoS2 films on SiO2 substrates by chemical vapor deposition. As-grown polycrystalline MoS2 films are continuous over the entire substrate surface with a tunable grain size from similar to 20 nm up to similar to 1 mu m. An obvious blue-shift (up to 80 meV) of photoluminescence peaks was observed from a series samples with different grain sizes. Back-gated field effect transistors based on a polycrystalline MoS2 film with a typical grain size of similar to 600 nm shows a field mobility of similar to 7 cm(2)/(V s) and on/off ratio of similar to 10(6), comparable to those achieved from exfoliated MoS2. Our work provides a route toward scaled-up synthesis of high-quality monolayer MoS2 for electronic and optoelectronic devices.

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