Journal
ACS NANO
Volume 7, Issue 10, Pages 9049-9054Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn403661h
Keywords
silicene; Dirac fermion; warping; chirality; scanning tunneling microscopy; molecular beam epitaxy
Categories
Funding
- MOST of China [2012CB921703, 2013CB921702, 2013CBA01600, 2011CBA00100]
- NSF of China [11174344, 91121003, 11074289, 11174337, 11225418]
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We performed low temperature scanning tunneling microscopy (STM) and spectroscopy (STS) studies on the electronic properties of (root 3 x root 3)R30 degrees phase of silicene on Ag(111) surface. We found the existence of Dirac Fermion chirality through the observation of -1.5 and -1.0 power law decay of quasiparticle interference (QPI) patterns. Moreover, in contrast to the trigonal warping of Dirac cone in graphene, we found that the Dirac cone of silicene is hexagonally warped, which is further confirmed by density functional calculations and explained by the unique superstructure of silicene. Our results demonstrate that the (root 3 x root 3)R30 degrees phase is an ideal system to investigate the unique Dirac Fermion properties of silicene.
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