Journal
ACS NANO
Volume 6, Issue 8, Pages 7381-7388Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn3025173
Keywords
nanomaterial; atomic layer; Raman enhancement; characterization
Categories
Funding
- Ministry of Education, Culture, Sports, Science and Technology of Japan [21241038]
- FIRST Program from the Japan Society for the Promotion of Science
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We demonstrate the possibility in quantifying the Raman intensities for both specimen and substrate layers In a common stacked experimental configuration and, consequently, propose a general and 4 Excitation Raman scattering rapid thickness identification technique for atomic-scale layers on Unprecedentedly wide-range Raman data for atomically flat MoS2 flakes are collected to compare with theoretical models. We reveal that all intensity features can be accurately captured when including optical interference effect. Surprisingly, we find that even freely suspended chalcogenide few-layer flakes have a stronger Raman response than that from the bulk phase. Importantly, despite the oscillating intensity of specimen spectrum versus thickness, the substrate weighted spectral intensity becomes monotonic. Combined with its sensitivity to specimen thickness, we suggest this quantity can be used to rapidly determine the accurate thickness for atomic layers.
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