4.8 Article

Aligned Sub-10-nm Block Copolymer Patterns Templated by Post Arrays

Journal

ACS NANO
Volume 6, Issue 3, Pages 2071-2077

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/nn203767s

Keywords

block copolymer; self-assembly; templated self-assembly; nanolithography; line pattern; high throughput

Funding

  1. Office of Naval Research (ONR)
  2. National Science Foundation
  3. Semiconductor Research Corporation
  4. UCLA FENA Center
  5. Samsung
  6. Division Of Materials Research
  7. Direct For Mathematical & Physical Scien [1007760] Funding Source: National Science Foundation

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Self-assembly of block copolymer films can generate useful periodic nanopatterns, but the self-assembly needs to be templated to impose long-range order and to control pattern registration with other substrate features. We demonstrate here the fabrication of aligned sub-10-nm line width patterns with a controlled orientation by using lithographically formed post arrays as templates for a 16 kg/mol poly(styrene-block-dimethylsiloxane) (PS-b-PDMS) diblock copolymer. The in-plane orientation of the block copolymer cylinders was controlled by varying the spacing and geometry of the posts, and the results were modeled using 3D self-consistent field theory. This work illustrates how arrays of narrow lines with specific in-plane orientation can be produced, and how the post height and diameter affect the self-assembly.

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