Journal
ACS NANO
Volume 5, Issue 7, Pages 5683-5691Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn2013518
Keywords
scanning probe microscopy; ferroelectric thin films; electrochemical phenomena; oxides
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Funding
- Office of Basic Energy Sciences, U.S. Department of Energy
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Applications of piezoresponse force microscopy and conductive atomic force microscopy to ferroelectric thin films necessitate understanding of the possible bias-induced electrochemical reactivity of oxide surfaces. These range from reversible Ionic surface charging (possibly coupled to polarization) and vacancy and proton injection to partially reversible vacancy ordering, to irreversible electrochemical degradation of the film and bottom electrode. Here, the electrochemical phenomena induced by a biased tip are analyzed and both theoretical and experimental criteria for their identification are summarized.
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