Journal
ACS NANO
Volume 5, Issue 8, Pages 6102-6108Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn1009352
Keywords
graphene; sonication-assisted dispersion; scanning tunneling microscopy; X-ray photoelectron spectroscopy
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Funding
- Department of Energy [DE-AC02-98CH10886]
- Columbia University by the National Science Foundation [CHE-07-01483]
- National Science Foundation through the NSEC [CHE-06-41523]
- New York State Office of Science, Technology, and Academic Research (NYSTAR)
- National Science Foundation [CHE-0650123]
- National Science Foundation through IGERT [DGE-0549399]
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We describe scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films produced by sonication-assisted dispersion. Defects In these samples are not randomly distributed, and the graphene films exhibit a patchwork structure where unperturbed graphene areas are adjacent to heavily functionalized ones. Adjacent graphene layers are likely in poor mechanical contact due to adventitious species trapped between the carbon sheets of the sample.
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