Journal
ACS NANO
Volume 4, Issue 5, Pages 2695-2700Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn1003937
Keywords
MoS2; Raman spectroscopy; layered material; two-dimensional crystal; interlayer interaction; vibration; phonon
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Funding
- National Research Foundation of Korea (NRF)
- Ministry of Education, Science and Technology [2009-0066575]
- U.S. Department of Energy [DE-SC00001085]
- Office of Basic Energy Sciences [DE FG 02-98ER14861, DE FG 03ER154631]
- New York State NYSTAR program
- National Research Foundation of Korea [2009-0066575] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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Molybdenum disulfide (MoS2) of single- and few-layer thickness was exfoliated on SiO2/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic force microscopy. Two Raman modes, E-2g(1) and A(1g), exhibited sensitive thickness dependence, with the frequency of the former decreasing and that of the latter increasing with thickness. The results provide a convenient and reliable means for determining layer thickness with atomic-level precision. The opposite direction of the frequency shifts, which cannot be explained solely by van der Waals interlayer coupling, is attributed to Coulombic interactions and possible stacking-induced changes of the intralayer bonding. This work exemplifies the evolution of structural parameters in layered materials in changing from the three-dimensional to the two-dimensional regime.
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