Journal
ACS NANO
Volume 5, Issue 1, Pages 315-320Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nn1027278
Keywords
surface properties; depth profiling; block copolymers; semicrystalline polymers; atomic force microscopy
Categories
Funding
- Volkswagen Foundation
Ask authors/readers for more resources
Nondestructive depth-resolved imaging of similar to 20-nm-thick surface layers of soft polymeric materials: is demonstrated using amplitude modulation atomic force microscopy (AM-AFM). From a map of amplitude-phase-distance curves, the tip indentation into the specimen is determined. This serves as a depth coordinate for reconstructing cross sections and volume images of the specimen's mechanical properties Our method reveals subsurface structures which are not discernible using conventional AM-AFM. Results for surfaces of a block, copolymer and a semicrystalline polymer are presented.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available