4.8 Article

Revealing the Relationship between Energy Level and Gas Sensing Performance in Heteroatom-Doped Semiconducting Nanostructures

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 10, Issue 35, Pages 29795-29804

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.8b10057

Keywords

gas sensor; In2O3; sensing mechanism; Fermi level; electronic structure

Funding

  1. National Key R&D Program of China [2017YFA0207800]
  2. National Natural Science Foundation of China (NSFC) [21771079]
  3. Jilin Province Science and Technology Development Plan [20170101141JC]
  4. Young Elite Scientist Sponsorship Program by CAST
  5. Program for JLU Science and Technology Innovative Research Team (JLUSTIRT)
  6. Fok Ying Tung Education Foundation [161011]
  7. Postdoctoral Innovative Talent Support Program [BX20180120]

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The cation substitutional doping of metal oxide semiconductors plays pivotal roles in improving the gas sensing performances, but the doping effect on surface sensing reaction is still not well understood. In this study, indium oxides doped with various heteroatoms are investigated to obtain in-depth understanding of how doping (or the resulting change in the electronic structure) alters the surface-absorbed oxygen chemistry and subsequent sensing process. The experimental results reveal that energy level of In2O3 can be modulated by introduction of these dopants, some of which (e.g., Al, Ga, and Zr) lead to the elevation of Fermi level, whereas others (e.g., Ti, V, Cr, Mo, W, and Sn) bring about relative drop in Fermi level. However, only the former can improve the response to formaldehyde, indicating a strong link between Fermi level and sensing properties. Mechanistic study suggests that the elevation of Fermi level increases energy level difference between oxide semiconductor and oxygen molecules and facilitates the surface absorption of oxygen species, resulting in superior formaldehyde sensing activity. Especially, Al-doped In2O3 exhibits remarkably enhanced sensing performances toward formaldehyde at low working temperature (150 degrees C) with high response, good selectivity, ultralow limit of detection (60 ppb), and short response time (2-23 s). Our findings not only promote the understanding of sensing reaction process and its correlation with the semiconductor electronic structure but also offer a general guideline for large-scale screening of promising oxide semiconductor-based sensing materials for gas detection.

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