Energy-Storage Properties and Electrocaloric Effect of Pb(1-3x/2)LaxZr0.85Ti0.15O3 Antiferroelectric Thick Films

Antiferroelectric (AFE) thick (1 mu m) films of Pb(1-3x/2)LaxZr0.85Ti0.15O3 (PLZT) with x = 0.08, 0.10, 0.12, and 0.14 were deposited on LaNiO3/Si (100) substrates by a sol gel method. The dielectric properties, energy-storage performance, electrocaloric effect, and leakage current behavior were investigated in detail. With increasing La content, dielectric constant and saturated polarizations of the thick films were gradually decreased. A maximum recoverable energy-storage density of 38 J/cm(3) and efficiency of 7196 were achieved in the thick films with x = 0.12 at room temperature. A large reversible adiabatic temperature change of Delta T = 25.0 degrees C was presented in the thick films with x = 0.08 at 127 degrees C at 990 kV/cm. Moreover, all the samples had a lower leakage current density below 10(-6) A/cm(2) at room temperature. These results indicated that the PLZT AFE thick films could be a potential candidate for applications in high energy-storage density capacitors and cooling devices.