Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 4, Issue 3, Pages 1149-1153Publisher
AMER CHEMICAL SOC
DOI: 10.1021/am201469t
Keywords
polymer light-emitting electrochemical cell (LEC); organic electronics; electrochemical doping; conjugated polymers; secondary ion beam mass spectrometry
Funding
- Research Corporation Cottrell College
- National Science Foundation [CHE-0935920, DMR-1057209]
- Western Washington University
- Department of Energy's Office of Biological and Environmental Research
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1057209] Funding Source: National Science Foundation
- Division Of Chemistry
- Direct For Mathematical & Physical Scien [0935920] Funding Source: National Science Foundation
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Ion profiles in polymer light-emitting electrochemical cells are known to significantly affect performance and stability, but are not easily measured. Here, secondary ion mass spectrometry is used to investigate ion profiles in both dynamic and chemically fixed junction devices. Results indicate lower reversibility of dynamic junctions and a more significant time delay for ion redistribution than previously expected, but confirm the complete immobilization of ions in chemically fixed junction devices. When compared with prier studies analyzing the electric field profiles in similar devices, these results help to elucidate the roles of ion distribution and electrochemical doping in LECs.
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