Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 2, Issue 2, Pages 511-520Publisher
AMER CHEMICAL SOC
DOI: 10.1021/am9007648
Keywords
self-assembled monolayer; organic semiconductor; organic field-effect transistor; hybrid materials
Funding
- NSF [DMR-0120967]
- AFOSR [FA9550-09-1-0426]
- ONR [N00014-08-1-1227]
- Boeing-Johnson Foundation
- Micron Foundation
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In this paper, we report on n-alkyl phosphonic acid (PA) self-assembled monolayer (SAM)/hafnium oxide (HfO2), hybrid dielectrics utilizing the advantages of SAMs for control over the dielectric/semiconductor interface with those of high-h metal oxides for low-voltage organic thin him transistors (OTFTs). By systematically varying the number of carbon atoms of the n-alkyl PA SAM from six to eighteen on HfO2 with stable and low leakage current density, we observe how the structural nature of the SAM affects the thin-film crystal structure and morphology, and subsequent device performance of low-voltage pentacene based OTFTs. We Find chat two primary structural Factors of the SAM play a critical role in optimizing the device electrical characteristics, namely, the order/disorder of the SAM and its physical thickness. High saturation-held-effect mobilities result at a balance between disordered SAMs to promote large pentacene grains and thick SAMs to aid in physically buffering the charge carriers in pentacene from the adverse effects of the underlying high-k oxide. Employing the appropriate n-alkyl PA SAM/HfO2 hybrid dielectrics, pentacene-based OTFTs operate under -2.0 V with low hysteresis, on-off current ratios above 1 x 10(6), threshold voltages below -0.6 V, subthreshold slopes as low as 100 mV dec(-1), and field-effect mobilities as high as 1.8 cm(2) V-1 s(-1).
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