Journal
CHEMISTRYSELECT
Volume 3, Issue 24, Pages 6729-6736Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/slct.201800827
Keywords
Nickel Oxide; Photocathode; Surface Reconstruction; XRD
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Funding
- Center for Nanotechnology Applied to Engineering (CNIS) of the University of Rome LA SAPIENZA
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For the first time it is shown that the NiO films operating as photocathodes in dye-sensitized solar cells (DSCs), alter their X-ray diffraction (XRD) pattern upon occurrence of the photoelectrochemical reaction of reduction. In particular, it has been observed that mesoporous NiO sensitized with Fast Green (FG) presents splitting and broadening of its characteristic XRD peaks after device operation in p-type DSC (p-DSC) and tandem DSC (t-DSC). The nature of the changes in the diffraction pattern of NiO does not vary with the magnitude of the current passing through the p-DSC and the t-DSC with NiO photocathodes. Such a combination of facts would indicate that the photoelectrochemical process of holes photoinjection mediated by the sensitizer is responsible of the structural variations in NiO photocathode. At a microscopic level, we attributed such modifications to the reconstruction of the NiO electrode following the realization of the dye-mediated process of electron transfer with lattice deformation possibly due to the inclusion of the chemisorbed sensitizer in the oxide structure. This observation opens up a completely new direction of research in the field of DSC and analogous devices as far as the analysis and the understanding of the interactions dye/semiconductor in the common operative conditions of a DSC are concerned.
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