Nanoscale elastic strain mapping of polycrystalline materials

Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The +/- 2 sigma strain resolution was determined to be 0,15% and 0.10% for poly crystalline copper and boron carbide, respectively. LocaI strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. [GRAPHICS] IMPACT STATEMENT This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.