Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 25, Issue -, Pages 1060-1067Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577518006318
Keywords
X-ray detector; beam position monitor; diamond; ultra-nanocrystalline; flux monitor
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Funding
- US Department of Energy, Office of Basic Energy Sciences [DE-SC0012704, DE-AC02-98CH10886]
- US Department of Energy, Office of High Energy Physics Award [DE-SC0015841]
- US Department of Energy, Office of Science [DE-AC02-06CH11357]
- National Institute of Biomedical Imaging and Bioengineering [P30-EB-009998]
- NSF
- NIH/NIGMS via NSF [DMR-1332208]
- U.S. Department of Energy (DOE) [DE-SC0015841] Funding Source: U.S. Department of Energy (DOE)
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Diamond X-ray detectors with conducting nitrogen-incorporated ultra-nanocrystalline diamond (N-UNCD) films as electrodes were fabricated to measure X-ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N-UNCD films grown on unseeded diamond substrates were compared with N-UNCD films grown on a seeded silicon substrate. The feasibility of the N-UNCD films acting as electrodes for X-ray detectors was confirmed by the stable performance in a monochromatic X-ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.
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