4.2 Article

Radiation-driven rotational motion of nanoparticles

Journal

JOURNAL OF SYNCHROTRON RADIATION
Volume 25, Issue -, Pages 757-762

Publisher

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577518005039

Keywords

rotational X-ray tracking; radiation pressure; rotational dynamics

Funding

  1. National Science Foundation [DMR03-08660]
  2. University of Illinois at Urbana-Champaign, Materials Research Laboratory [DMR-9724294]
  3. DOE, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
  4. US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC00112704]
  5. EPSRC [EP/I022562/1]

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Focused synchrotron beams can influence a studied sample via heating, or radiation pressure effects due to intensity gradients. The high angular sensitivity of rotational X-ray tracking of crystalline particles via their Bragg reflections can detect extremely small forces such as those caused by field gradients. By tracking the rotational motion of single-crystal nanoparticles embedded in a viscous or viscoelastic medium, the effects of heating in a uniform gradient beam and radiation pressure in a Gaussian profile beam were observed. Changes in viscosity due to X-ray heating were measured for 42 mm crystals in glycerol, and angular velocities of 10(-6) rad s(-1) due to torques of 10(-24) N m were measured for 340 nm crystals in a colloidal gel matrix. These results show the ability to quantify small forces using rotation motion of tracer particles.

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