Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 25, Issue -, Pages 757-762Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577518005039
Keywords
rotational X-ray tracking; radiation pressure; rotational dynamics
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Funding
- National Science Foundation [DMR03-08660]
- University of Illinois at Urbana-Champaign, Materials Research Laboratory [DMR-9724294]
- DOE, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
- US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC00112704]
- EPSRC [EP/I022562/1]
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Focused synchrotron beams can influence a studied sample via heating, or radiation pressure effects due to intensity gradients. The high angular sensitivity of rotational X-ray tracking of crystalline particles via their Bragg reflections can detect extremely small forces such as those caused by field gradients. By tracking the rotational motion of single-crystal nanoparticles embedded in a viscous or viscoelastic medium, the effects of heating in a uniform gradient beam and radiation pressure in a Gaussian profile beam were observed. Changes in viscosity due to X-ray heating were measured for 42 mm crystals in glycerol, and angular velocities of 10(-6) rad s(-1) due to torques of 10(-24) N m were measured for 340 nm crystals in a colloidal gel matrix. These results show the ability to quantify small forces using rotation motion of tracer particles.
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