Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 25, Issue -, Pages 580-591Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577518001200
Keywords
resonant inelastic X-ray scattering; X-ray emission; ID20 beamline; RIXS spectrometer; ESRF
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Funding
- ESRF
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An end-station for resonant inelastic X-ray scattering and (resonant) X-ray emission spectroscopy at beamline ID20 of ESRF - The European Synchrotron is presented. The spectrometer hosts five crystal analysers in Rowland geometry for large solid angle collection and is mounted on a rotatable arm for scattering in both the horizontal and vertical planes. The spectrometer is optimized for high-energy-resolution applications, including partial fluorescence yield or high-energy-resolution fluorescence detected X-ray absorption spectroscopy and the study of elementary electronic excitations in solids. In addition, it can be used for non-resonant inelastic X-ray scattering measurements of valence electron excitations.
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