Emerging Characterizing Techniques in the Fine Structure Observation of Metal Halide Perovskite Crystal

Driven by its appealing application in the energy harvesting industry, metal halide perovskite solar cells are attracting increasing attention from various fields, such as chemistry, materials, physics, and energy-related industries. While the energy conversion efficiency of the perovskite solar cell is being investigated often by various research groups, the relationship between the surface structure and the property is still ambiguous and, therefore, becomes an urgent topic due to its wide application in the real environment. Recently, the fine structure characterization of perovskite crystals has been analysed by varying techniques, such as XRD, synchrotron-based grazing incidence XRD, XAFS, and STM, in addition to others. In this review article, we will summarize recent progresses in the monitoring of fine nanostructures of the surface and crystal structures of perovskite films, mainly by XAFS, XRD, and STM, focusing on the discussion of the relationship between the properties and the stability of perovskite solar cells. Furthermore, a prospective is given for the development of experimental approaches towards fine structure characterization.