4.6 Review

Brief Review of Surface Passivation on III-V Semiconductor

Journal

CRYSTALS
Volume 8, Issue 5, Pages -

Publisher

MDPI
DOI: 10.3390/cryst8050226

Keywords

III-V semiconductor; passivation; MOCAP; ALD; XPS

Funding

  1. Jilin Province Science and Technology Development Plan [20170520169JH, 20160204069GX, 20170101111JC]
  2. National Natural Science Foundation of China [51672103, 61774024]
  3. National Key RD Project [2016YFB0401103, 2017YFB0405100]

Ask authors/readers for more resources

The III-V compound semiconductor, which has the advantage of wide bandgap and high electron mobility, has attracted increasing interest in the optoelectronics and microelectronics field. The poor electronic properties of III-V semiconductor surfaces resulting from a high density of surface/interface states limit III-V device technology development. Various techniques have been applied to improve the surface and interface quality, which cover sulfur-passivation, plasmas-passivation, ultrathin film deposition, and so on. In this paper, recent research of the surface passivation on III-V semiconductors was reviewed and compared. It was shown that several passivation methods can lead to a perfectly clean surface, but only a few methods can be considered for actual device integration due to their effectiveness and simplicity.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available