Journal
IEEE TRANSACTIONS ON PLASMA SCIENCE
Volume 43, Issue 2, Pages 675-682Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPS.2014.2382876
Keywords
Kinetic ions; particle-in-cell (PIC) simulation; plasma-material surface interaction; secondary electron emission
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Funding
- National Science Council of Taiwan [100-2112-M-006-021-MY3]
- National Cheng Kung University Top University Project
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An electrostatic particle-in-cell simulation code is developed to investigate the interaction between plasma and material surfaces in the presence of secondary electron emission. Kinetic ions are included into the numerical simulation to incorporate the process of ion bombardment on the material surfaces. The influences of the secondary electron emission on sheath dynamics are further investigated, which is induced by ions on top of electrons.
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