Journal
ACS PHOTONICS
Volume 5, Issue 6, Pages 2234-2242Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.8b00086
Keywords
spectroscopic ellipsometry; total internal reflection ellipsometry; hyperbolic metamaterial; anisotropic metamaterial
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Funding
- University of Maryland
- National Institute of Standards and Technology Center for Nanoscale Science and Technology through the University of Maryland [70NANB14H209]
- National Science Foundation (NSF) [DMR 1120923]
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Hyperbolic metamaterials are optical materials characterized by highly anisotropic effective permittivity tensor components having opposite signs along orthogonal directions. The techniques currently employed for characterizing the optical properties of hyperbolic metamaterials are limited in their capability for robust extraction of the complex permittivity tensor. Here we demonstrate how an ellipsometry technique based on total internal reflection can be leveraged to extract the permittivity of hyperbolic metamaterials with improved robustness and accuracy. By enhancing the interaction of light with the metamaterial stacks, improved ellipsometric sensitivity for subsequent permittivity extraction is obtained. The technique does not require any modification of the hyperbolic metamaterial sample or sophisticated ellipsometry setup and could therefore serve as a reliable and easy-to-adopt technique for characterization of a broad class of anisotropic metamaterials.
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