4.6 Article

Atomic-scale mechanisms of defect- and light-induced oxidation and degradation of InSe

Journal

JOURNAL OF MATERIALS CHEMISTRY C
Volume 6, Issue 3, Pages 518-525

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/c7tc04738j

Keywords

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Funding

  1. Agency for Science, Technology and Research (A*STAR), Singapore
  2. Science and Engineering Research Council [152-70-00017]
  3. Ministry of Education, Singapore (Academic Research Fund) [TIER 1-RG128/14]
  4. Russian Science Foundation [14-13-00982]
  5. Russian Science Foundation [17-13-00090] Funding Source: Russian Science Foundation

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Layered indium selenide (InSe), a new two-dimensional (2D) material with a hexagonal structure and semiconducting characteristics, is gaining increasing attention owing to its intriguing electronic properties. Here, by using first-principles calculations, we reveal that perfect InSe possesses high chemical stability against oxidation, superior to MoS2. However, the presence of intrinsic Se vacancy (V-Se) and light illumination can markedly affect its surface activity. In particular, the excess electrons associated with the exposed In atoms at the V-Se site under illumination are able to remarkably reduce the dissociation barrier of O-2 to similar to 0.2 eV. Moreover, under ambient conditions, the splitting of O-2 enables the formation of substitutional (apical) oxygen atomic species, which further cause the trapping and subsequent rapid splitting of H2O molecules and ultimately the formation of hydroxyl groups. Our findings uncover the causes and underlying mechanisms of InSe surface degradation via defect-photo-promoted oxidations. Such results will be beneficial in developing strategies for the storage of the InSe material and its applications for surface passivation with boron nitride, graphene or In-based oxide layers.

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