4.6 Article

Improvement of Thermal Environment by Thermoelectric Coolers and Numerical Optimization of Thermal Performance

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 62, Issue 8, Pages 2579-2586

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2015.2442530

Keywords

Controlled-collapse-chip-connection (C4); Seebeck; thermal runaway; thermal stability; thermoelectric coolers (TECs)

Funding

  1. Shanghai Science and Technology Committee [13511500900]
  2. Specialized Research Fund for the Doctoral Program of Higher Education [20120073130003]
  3. Key Laboratory of Ministry of Education of Design and Electromagnetic Compatibility of High Speed Electronic System [2014001]
  4. National Natural Science Foundation of China [61234001]

Ask authors/readers for more resources

Seeking for an available thermal runaway solution is becoming one important and challenging issue in current nanometer ICs. Thermoelectric coolers (TECs) may give a solution. In this paper, a simplified power model of circuits closely associated with temperature with and without repeaters is derived. Based on the surface temperature difference and heat-flow density, an equivalent thermal resistance model for powered TECs is proposed. According to the thermal profile model, the steady-state temperature is calculated for the same chip with two different package forms. Finally, optimizations of p-n couples are performed with the purpose of obtaining the maximum coefficient of performance (COP) and minimum TECs power. As compared with the traditional flip-flop controlled-collapse-chip-connection package, the results reveal desirable conclusions that a 15.8% decrease of the chip stability temperature with the COP optimization at I = 2.5 A and 11.4% steady-state power savings with the 13.2 W TEC power consumption are obtained in a 50-nm technology node. Analysis demonstrates that the maximum COP and minimum power consumed by TECs can be obtained at different optimum numbers of p-n couples, which is independent of electrical current across by TECs.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available