Journal
ACS COMBINATORIAL SCIENCE
Volume 20, Issue 3, Pages 127-131Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acscombsci.7b00171
Keywords
combinatorial materials chip; Fe-Co-Ni; X-ray diffraction; hierarchical clustering; phase diagram
Funding
- National Key Research and Development Program of China [2017YFB0701900]
- National High Technology Research and Development Program of China [SS2015AA034204]
- Science and Technology Commission of Shanghai Municipality [15DZ2260303, 16DZ2260602]
Ask authors/readers for more resources
One hundred nanometer thick Fe-Co-Ni material chips were prepared and isothermally annealed at 500, 600, and 700 degrees C, respectively. Pixel-by-pixel composition and structural mapping was performed by microbeam X-ray at synchrotron light source. Diffraction images were recorded at a rate of 1 pattern/s. The XRD patterns were automatically processed, phase-identified, and categorized by hierarchical clustering algorithm to construct the composition-phase map. The resulting maps are consistent with corresponding isothermal sections reported in the ASM Alloy Phase Diagram Database, verifying the effectiveness of the present approach in phase diagram construction.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available