Journal
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
Volume 62, Issue 6, Pages 573-577Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCSII.2015.2407711
Keywords
Field-programmable gate arrays (FPGAs); magnetic tunnel junction (MTJ); magnetoresistive random-access memory (MRAM); nonvolatile (NV); spin-transfer-torque (STT); static random-access memory (SRAM)
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Funding
- Natural Sciences and Engineering Research Council of Canada
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Adding a spin-transfer-torque (STT) magnetoresistive random-access memory (MRAM) to a static random-access memory (SRAM) cell to produce an MRAM-backed SRAM cell for a nonvolatile field-programmable gate array (FPGA) is proposed. The proposed cell reduces the time to reconfigure the FPGA following a power-down and enables fast wake-ups and power gating. With the proposed restore operation, data are recalled with no error even in the presence of mismatch. Simulation results confirm that data can be stored in the proposed cell in 80 ns and restored in less than 1 ns.
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