Journal
X-RAY FREE-ELECTRON LASERS: BEAM DIAGNOSTICS, BEAMLINE INSTRUMENTATION, AND APPLICATIONS
Volume 8504, Issue -, Pages -Publisher
SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.929097
Keywords
ultrafast optics; ultrafast x-rays; thin films; ultrafast dynamics; LCLS; FEL; dielectric response; spectral encoding
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A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to similar to 10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si3N4). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.
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