The X-ray Extended Range Technique a model for investigating X-ray and electron collision processes at a synchrotron.

New techniques at synchrotrons can not only drive higher accuracy, structural information and insight in photoabsorption and inelastic scattering of the photon, but also inelastic scattering of the electron. This is important for fields such as XAFS, XANES and powder diffraction, but has also initiated new fields of nanoroughness measurement, measurement of electron inelastic mean free paths, bonding information at an accuracy of crystallographic determination, and similar advances for fluorescence and scattering investigations. We summarise and present some key opportunities for research and development.