4.8 Article

Wafer-recyclable, environment-friendly transfer printing for large-scale thin-film nanoelectronics

Publisher

NATL ACAD SCIENCES
DOI: 10.1073/pnas.1806640115

Keywords

transfer printing method; thin-film nanoelectronics; Internet of Things; delamination; nondestructive wafer recycling

Funding

  1. Purdue University
  2. Air Force Research Laboratory [S-114-054-002]
  3. National Science Foundation Division of Civil, Mechanical, and Manufacturing Innovation Grant [1728149]
  4. University of Virginia

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Transfer printing of thin-film nanoelectronics from their fabrication wafer commonly requires chemical etching on the sacrifice of wafer but is also limited by defects with a low yield. Here, we introduce a wafer-recyclable, environment-friendly transfer printing process that enables the wafer-scale separation of high-performance thin-film nanoelectronics from their fabrication wafer in a defect-free manner that enables multiple reuses of the wafer. The interfacial delamination is enabled through a controllable cracking phenomenon in a water environment at room temperature. The physically liberated thin-film nanoelectronics can be then pasted onto arbitrary places of interest, thereby endowing the particular surface with desirable add-on electronic features. Systematic experimental, theoretical, and computational studies reveal the underlying mechanics mechanism and guide manufacturability for the transfer printing process in terms of scalability, controllability, and reproducibility.

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