4.8 Article

Atomic-Scale Measurement of Flexoelectric Polarization at SrTiO3 Dislocations

Journal

PHYSICAL REVIEW LETTERS
Volume 120, Issue 26, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.120.267601

Keywords

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Funding

  1. Japan Society for the Promotion of Science (JSPS) [JP17H06094]
  2. JSPS [25106003]
  3. Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT) [12024046]
  4. Japan Society for the Promotion of Science (JSPS) fellowship
  5. National Key R&D Program of China [2016YFA0300804, 2016YFA0300903]
  6. National Natural Science Foundation of China [51672007, 51502007, 11327902]
  7. National Equipment Program of China [ZDYZ2015-1]
  8. National Program for Thousand Young Talents of China
  9. 2011 Program Peking-Tsinghua-IOP Collaborative Innovation Center for Quantum Matter
  10. National Basic Research Program of China [2015CB921700, 2016YFA0301004]
  11. Beijing Advanced Innovation Center for Future Chip (ICFC)

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Owing to the broken translational symmetry at dislocations, a strain gradient naturally exists around the dislocation cores and can significantly influence the electrical and mechanical properties. We use aberration corrected scanning transmission electron microscopy to directly measure the flexoelectric polarization (similar to 28 mu C cm(-2)) at dislocation cores in SrTiO3. The polarization charges can interact with the non-stoichiometric dislocation cores and thus impact the electrical activities. Our findings can help us to understand the properties of dislocations in perovskite, providing new insights into the design of new devices via defect engineering such as bicrystal fabrication and thin film growth.

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