Journal
ADVANCED X-RAY CHARACTERIZATION TECHNIQUES
Volume 620, Issue -, Pages 213-+Publisher
TRANS TECH PUBLICATIONS LTD
DOI: 10.4028/www.scientific.net/AMR.620.213
Keywords
XRD; XPS; vertically aligned single-walled carbon nanotube; alcohol catalytic CVD; cobalt catalyst; aluminum oxide support layer
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Al oxide (Al-O) films used as catalyst-support layer for vertical growth of carbon nanotubes (CNTs) were characterized by means of X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission, and scanning electron microscopies (TEM and SEM). EB-deposited Al films (20 nm) were thermally-oxidized at 400 degrees C (10 min, static air) to produce the surface structure of Al-O. The Al-O was found amorphous and after the incorporation with Co catalyst, the grown CNTs were twisted together before vertically grown. The prepared Al-O surface is an electron-acceptor-dominated (oxygen-rich) surface where the formation of active catalyst could be enhanced to promote the vertically aligned CNT growth.
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