Journal
OPTIK
Volume 154, Issue -, Pages 435-440Publisher
ELSEVIER GMBH, URBAN & FISCHER VERLAG
DOI: 10.1016/j.ijleo.2017.10.107
Keywords
Crystal growth; Optical studies; Nonlinear optical materials; X-ray diffraction
Categories
Funding
- UGC, New Delhi [F1-17.1/2015-16/MANF-2015-17-MAH-68193]
- Rashtria Uchachatar Shiksha Abhiyan (RUSA), Government of Maharashtra, UGC-DAE-CSR-RRCAT Indore, India [CSR-IC-BL66/CRS-183/2016-17/847, F.530/16/DRS-I/2016(SAP-II)]
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The current investigation is aimed to explore the optical properties of citrulline doped ammonium dihydrogen phosphate (NH4H2PO4,ADP) crystal by employing crystal growth, structural, IJV-vis, Kurtz-Perry test and Z-scan characterization techniques. The growth of citrulline doped ADP single crystal has been achieved by slow solvent evaporation technique at ambient temperature. The pure and citrulline doped ADP crystals have been characterized by single crystal X-ray diffraction technique for structural analysis. The functional groups of grown crystal have been qualitatively identified by means of Fourier transform infrared analysis. The influence of citrulline on optical transmittance of ADP crystal has been evaluated within 200-900 nm by means of UV-vis spectral analysis. The enhanced second harmonic generation (SHG) efficiency of citrulline doped ADP crystal has been determined using the Q-switched mode Nd:YAG laser and it is found to be 2.18 times higher than standard KDP crystal. The third order nonlinear optical (TONLO) behavior of citrulline doped ADP crystal has been investigated using He-Ne laser operating at 632.8 nm. The close and open aperture Z-scan configuration has been used to evaluate the nature of TONLO refraction and absorption. The magnitude of TONLO parameters of citrulline doped ADP crystal has been determined using the Z-scan transmittance data. The potential liability of citrulline doped ADP crystal for optical applications has been discussed. (C) 2017 Elsevier GmbH. All rights reserved.
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