4.5 Article

Research on SAD-PRD losses in semiconductor waveguide for application in photonic integrated circuits

Journal

OPTIK
Volume 154, Issue -, Pages 748-754

Publisher

ELSEVIER GMBH, URBAN & FISCHER VERLAG
DOI: 10.1016/j.ijleo.2017.10.130

Keywords

SOI; Semiconductor waveguide SAD-PRD losses; Grating structure

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Scattering, absorption, diffraction, polarization, reflection and dispersion (SAD-PRD) losses in semiconductor waveguide at wavelength 1550 nm is dissected in present research. Two types of semiconductor waveguides such as silicon-Air and GaAs-Air deal with the current work to increase the efficiency of photonic integrated circuit. The appraisal of aforementioned losses is divulged using disparate notion, for example; reflection loss is scrutinized by employing transfer matrix method (TMM) whereas Maxwell's equation is deployed to disclose absorption loss. Further dispersion, diffraction, polarization and scattering losses are examined with the help of mathematical formulation. Eventually, the outcomes of the above investigation affirmed that the overall transmitted efficiency of Si-Air and GaAs-Air waveguide is more than 90% and 89% respectively pertaining to angle of deviation (-12 degrees to 12 degrees) from Bragg's angle. (C) 2017 Elsevier GmbH. All rights reserved.

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