4.8 Article

Improving Performance and Lifetime of Small-Molecule Organic Photovoltaic Devices by Using Bathocuproine-Fullerene Cathodic Layer

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 7, Issue 17, Pages 9262-9273

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.5b01888

Keywords

small-molecule organic photovoltaic; power conversion efficiency; lifetime; cathodic buffer layer; optical manipulation; morphology

Funding

  1. Ministry of Science and Technology [MOST 102-2221-E-131-026-MY2, 102-2221-E-131-030-MY2, 102-2221-E-011-142, 102-2511-S-131-002, 102-2622-E-011-018-CC3, 103-ET-E-011-004-ET, 103-2627-E-002-002, 103-2622-E-131-007-CC3, 104-2623-E-011-001-D]

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In this study, we compared the use of neat bathocuproine (BCP) and BCP:C-60 mixed buffer layers in chloroboron subphthalocyanine (SubPc)/C-60 bilayer organic photovoltaic (OPV) devices and analyzed their influence on device performance. Replacing the conventional BCP with BCP:C-60 enabled manipulating the optical field distribution for optimizing the optical properties of the devices. Estimation of the interfacial barrier indicated that the insertion of the BCP:C-60 between the C-60 and electrode can effectively reduce the barrier for electrons and enhance electron collection at the electrode. Temperature-dependent measurements of the OPV devices performed to calculate the barrier height at the SubPc/C-60 interface suggested that band bending was larger when the BCP:C-60 buffer layer was used, reflecting increased exciton dissociation efficiency. In addition, the device lifetime was considerably improved when the BCP:C-60 buffer layer was used. The device performance was stabilized after the photodegradation of the active layers, thereby increasing the device lifetime compared with the use of the neat BCP buffer layer. Atomic force microscopy images showed that the neat BCP was easily crystallized and could degrade the cathodic interface, whereas the blend of C-60 and BCP suppressed the crystallization of BCP. Therefore, the optimal buffer layer improved both the device performance and the device lifetime.

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