Journal
15TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS15)
Volume 430, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/430/1/012124
Keywords
-
Categories
Ask authors/readers for more resources
Quick scanning X-ray absorption spectroscopy was combined with the grazing incidence geometry for the time resolved in situ investigation of surfaces and thin films. The results demonstrate that a time resolution of about 50 ms for a single spectrum is feasible using a dedicated monochromator. In-situ investigations performed during the sputter deposition of thin gold films demonstrate the capabilities of this new approach.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available