Journal
11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012)
Volume 425, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/425/7/072006
Keywords
-
Ask authors/readers for more resources
A beamline for X-ray free electron laser (XFEL) has been developed at SACLA, SPring-8 Angstrom Compact free electron LAser. The beamline delivers and diagnoses an XFEL beam without degrading the beam quality. The transport optics are applicable in the range of 4-30 keV with a double-crystal monochromator or 4-15 keV with either of two double-mirror systems. A photon diagnostic system of the beamline monitors intensity, photon energy, center-of-mass position, and spatial profile in shot-by-shot and non-destructive manners.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
