4.7 Article

Development of scanning single port free space measurement setup for imaging reflection loss of microwave absorbing materials

Journal

MEASUREMENT
Volume 125, Issue -, Pages 114-122

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.measurement.2018.04.065

Keywords

Microwave absorbing material; Stealth material characterization; Microwave measurements; Permittivity; Permeability; Qt; QWT

Funding

  1. Ministry of Trade, Industry & Energy (MI, South Korea) [10074278]
  2. National Research Foundation of South Korea (NRF) - Ministry of Science, ICT & Future Planning [NRF-2017R1A5A1015311]

Ask authors/readers for more resources

This paper proposes a scanning free-space measurement (SFSM) setup for the evaluation of microwave absorption properties of microwave absorbing materials. The system comprises of a vector network analyzer (VNA), focused horn antennas attached to the VNA for transmitting/receiving microwave signals, a dual-axis automated translation stage for raster scanning of the specimen and a standard personal computer. A graphical user interface (GUI) running on the computer manages the configuration and synchronization of the VNA and the stage system, measurement reception from VNA and compilation of results for display to the user. The GUI is created in C + + using Qt framework and Qt Widgets for Technical applications. It is designed with a minimalistic approach to promote usability and adaptability.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available