Journal
MACHINING SCIENCE AND TECHNOLOGY
Volume 23, Issue 1, Pages 39-56Publisher
TAYLOR & FRANCIS INC
DOI: 10.1080/10910344.2018.1449218
Keywords
AFM nanomachining; acoustic emission monitoring; crack initiation; IZO-coated Pyrex glass; ploughing
Funding
- National Research Foundation of Korea [2017R1D1A1B03035551]
- National Research Foundation of Korea [2017R1D1A1B03035551] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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The goal of this research is to investigate and monitor machining mode transitions during nanoscale scratching of IZO-coated Pyrex glasses using atomic force microscope (AFM). Among the AFM nanomachining mode features, which include elastic/plastic deformations and crack generation, pile-up (by ploughing) is a key surface phenomenon that can represent plastic deformation characteristics, such as a sign of chip making. Moreover, because the pile-up formation mechanism of coated materials is reported to be distinct from that of bulk materials, the examination of pile-up in coated materials is challenging, along with brittle transition (crack initiation). In this research, the pile-up formation and crack initiation, that occur during nanoscratching, were examined and analyzed near the coating-substrate (glass) boundary. In addition, acoustic emission (AE), a sensing scheme with nanoscale sensitivity, was introduced to detect significant machining state variations and mode transitions. Experimental and analysis results indicate that the proposed scheme is viable for characterizing/monitoring the nanoscale machining of coated materials.
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