Journal
NONVOLATILE MEMORIES 2
Volume 58, Issue 5, Pages 59-65Publisher
ELECTROCHEMICAL SOC INC
DOI: 10.1149/05805.0059ecst
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Resistive random access memory (ReRAM) has become a promising candidate for next-generation high-performance nonvolatile memory that operates by electrically tuning resistance states via modulating vacancy concentrations. We demonstrate a wafer-scale process for resistive switching in tantalum oxide that is completely CMOS compatible. The resulting devices are forming-free and with greater than 1x10(5) cycle endurance.
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