Journal
JOURNAL OF MATERIALS SCIENCE
Volume 53, Issue 11, Pages 7953-7962Publisher
SPRINGER
DOI: 10.1007/s10853-018-2089-7
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Funding
- Russian Foundation for Basic Research
- Department of Science and Industrial Policy and Entrepreneurship of Moscow Government [15-33-70050-mol_a_mos, 16-29-06439-ofi_m]
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Gold porous films with an 2D inverse opal structure were prepared via electrochemical deposition for further application as SERS-active substrates for the on-chip analysis of heme B derivatives. The thickness of the deposited film was controlled through deposition charge while the grain size was dependent significantly on electrolyte content. A semiquantitative surface analysis of film composition and phase analysis of the gold films were performed by XPS and XRD methods while the observed local, Mie and Bragg plasmon resonance modes were discussed based on UV-vis reflectance data.
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