The origins and properties of intrinsic nonradiative recombination centers in wide bandgap GaN and AlGaN

The nonradiative lifetime (tau(NR)) of the near-band-edge emission in various quality GaN samples is compared with the results of positron annihilation measurement, in order to identify the origin and to determine the capture-cross-section of the major intrinsic nonradiative recombination centers (NRCs). The room-temperature tau(NR) of various n-type GaN samples increased with decreasing the concentration of divacancies composed of a Ga vacancy (V-Ga) and a N vacancy (V-N), namely, V-Ga V-N. The tau(NR) value also increased with increasing the diffusion length of positrons, which is almost proportional to the inverse third root of the gross concentration of all point defects. The results indicate that major intrinsic NRC in n-type GaN is VGaVN. From the relationship between its concentration and tau(NR), its hole capture-cross-section is estimated to be about 7 x 10(-14) cm(2). Different from the case of 4H-SiC, the major NRCs in p-type and n-type GaN are different: the major NRCs in Mg-doped p-type GaN epilayers are assigned to multiple vacancies containing a V-Ga and two (or three) V(N)s, namely, V-Ga(V-N)(n) (n - 2 or 3). The ion-implanted Mgdoped GaN films are found to contain larger size vacancy complexes such as (V-Ga)(3)(V-N)(3). In analogy with GaN, major NRCs in Al0.6Ga0.4N alloys are assigned to vacancy complexes containing an Al vacancy or a VGa. Published by AIP Publishing.