4.6 Article

X-ray absorption spectroscopy study of annealing process on Sr1-xLaxCuO2 electron-doped cuprate thin films

Journal

JOURNAL OF APPLIED PHYSICS
Volume 123, Issue 12, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.5021559

Keywords

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Funding

  1. National Science Foundation (NSF) [DMR-1610781]
  2. NSF MRSEC program [DMR-1719875]
  3. NSF [ECCS-15420819]
  4. Division Of Materials Research
  5. Direct For Mathematical & Physical Scien [1610781] Funding Source: National Science Foundation

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The superconducting properties of Sr1-xLaxCuO2 thin films are strongly affected by sample preparation procedures, including the annealing step, which are not always well controlled. We have studied the evolution of Cu L-2,L-3 and O K edge x-ray absorption spectra (XAS) of Sr1-xLaxCuO2 thin films as a function of reducing annealing, both qualitatively and quantitatively. By using linearly polarized radiation, we are able to identify the signatures of the presence of apical oxygen in the as-grown sample and its gradual removal as a function of duration of 350 degrees C Ar annealing performed on the same sample. Even though the as-grown sample appears to be hole doped, we cannot identify the signature of the Zhang-Rice singlet in the O K XAS, and it is extremely unlikely that the interstitial excess oxygen can give rise to a superconducting or even a metallic ground state. XAS and x-ray linear dichroism analyses are, therefore, shown to be valuable tools to improving the control over the annealing process of electron doped superconductors. Published by AIP Publishing.

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