Correction

Spectroscopic ellipsometry-based study of optical properties of amorphous and crystalline ZnSnO alloys and Zn2SnO4 thin films grown using sputtering deposition: Dielectric function and subgap states (vol 119, 135302, 2016)

JOURNAL OF APPLIED PHYSICS (2018)

Volume 123, Issue 8, Pages -

DOI: 10.1063/1.5022103

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