In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet

The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process. (C) 2018 Elsevier B.V. All rights reserved.